The Canadian Centre for Electron Microscopy (CCEM) houses best-in-class electron and ion microscopes and a team of expert staff who help users solve tomorrow’s materials problems.
CCEM provides an integrated pathway for materials research, from bulk imaging to atomic-scale analysis. By combining techniques like XCT, FIB, TEM, and APT, this multi-modal workflow enables high-precision insight into structural and compositional features across length scales. Its full capabilities were demonstrated through a successful multi-scale analysis of the Tarda meteorite, completed in collaboration with the Royal Ontario Museum. This milestone project confirms the workflow’s power for breakthrough discovery in geoscience, in addition to semiconductors, energy materials and more, reinforcing CCEM’s role as a global leader in advanced electron microscopy.